Single-domain epitaxial silicene on diboride thin films
- Japan Advanced Inst. of Science and Technology, Nomi, Ishikawa (Japan). School of Materials Science
- Japan Advanced Inst. of Science and Technology, Nomi, Ishikawa (Japan). School of Materials Science; Univ. College London, London (United Kingdom). London Centre for Nanotechnology; niv. College London, London (United Kingdom). Dept. of Chemistry
- Brookhaven National Lab. (BNL), Upton, NY (United States). Center for Functional Nanomaterials (CFN)
- IBM, Yorktown Heights, NY (United States). Thomas J. Watson Research Center
- IBM Research Division, Thomas J. Watson Research Center, Yorktown Heights, New York 10598, USA
- London Centre for Nanotechnology, University College London (UCL), London WC1H 0AH, United Kingdom; Department of Chemistry, UCL, London WC1H 0AJ, United Kingdom; Department of Physics and Astronomy, UCL, London WC1E 6BT, United Kingdom
Epitaxial silicene, which forms spontaneously on ZrB2(0001) thin films grown on Si(111) wafers, has a periodic stripe domain structure. By adsorbing additional Si atoms on this surface, we find that the domain boundaries vanish, and a single-domain silicene sheet can be prepared without altering its buckled honeycomb structure. The amount of Si required to induce this change suggests that the domain boundaries are made of a local distortion of the silicene honeycomb lattice. LastlThe realization of a single domain sheet with structural and electronic properties close to those of the original striped state demonstrates the high structural flexibility of silicene.
- Research Organization:
- Brookhaven National Lab. (BNL), Upton, NY (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC), Basic Energy Sciences (BES)
- Grant/Contract Number:
- SC0012704; 26790005; 26246002; EP/H026622/1; EP/G036675/1
- OSTI ID:
- 1335439
- Report Number(s):
- BNL-112106-2016-JA; APPLAB; R&D Project: 16083/16083; KC0403020
- Journal Information:
- Applied Physics Letters, Vol. 108, Issue 15; ISSN 0003-6951
- Publisher:
- American Institute of Physics (AIP)Copyright Statement
- Country of Publication:
- United States
- Language:
- English
Cited by: 13 works
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