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Title: Extensive domain wall motion and deaging resistance in morphotropic 0.55Bi(Ni1/2Ti1/2)O3–0.45PbTiO3 polycrystalline ferroelectrics

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.4870506· OSTI ID:1327044
 [1];  [2];  [2];  [2];  [3]
  1. Department of Materials Science and Engineering, University of Florida, Gainesville, Florida 32611, USA
  2. Department of Physical Chemistry, University of Science and Technology Beijing, Beijing 100083, China
  3. Department of Materials Science and Engineering, North Carolina State University, Raleigh, North Carolina 27695, USA

Domain wall motion is known as a major source of extrinsic contributions to the dielectric and piezoelectric properties of ferroelectric materials. In the present work, we report the extent of non-180° domain wall motion during strong and weak electric field amplitudes in situ using time-resolved, high-energy X-ray diffraction in the ferroelectric morphotropic phase boundary composition 0.55Bi(Ni1/2Ti1/2)O3–0.45PbTiO3 (BNT-45PT). After application of strong electric fields, two phases are shown to coexist. In the tetragonal phase of this material, the extent of 90° domain wall motion is significant and the domain alignment is nearly saturated. Weak (subswitching) cyclic electric fields are then also shown to induce domain wall motion. Deaging, or the progressive loss of preferred domain orientation during sequentially increasing field amplitudes, is notably low in these materials, showing that the initial domain alignment is strongly stabilized. Overall, the in situ measurements reveal that domain wall motion significantly impacts the structure and properties of BNT-45PT and reinforces the importance of understanding domain wall motion contributions to the physical properties of ferroelectrics.

Research Organization:
Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
Sponsoring Organization:
U.S. ARMY RESEARCHFOREIGN
OSTI ID:
1327044
Journal Information:
Applied Physics Letters, Vol. 104, Issue 13; ISSN 0003-6951
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
ENGLISH

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