Quantifying Atomic Arrangements of Si/SiGe Heterostructure Interfaces

Leonard, Donovan N; More, Karren Leslie; Edge, Lisa; Jackson, Clayton; Pritchett, Emily; Deelman, Peter

Quantifying Atomic Arrangements of Si/SiGe Heterostructure Interfaces

Conference · Fri Jan 01 04:00:00 EST 2016

OSTI ID:1324086

Leonard, Donovan N ^[1]; More, Karren Leslie ^[1]; Edge, Lisa ^[2]; Jackson, Clayton ^[2]; Pritchett, Emily ^[2]; Deelman, Peter ^[2]

ORNL
HRL Laboratories, LLC., Mailbu, CA

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Research Organization:: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)

Sponsoring Organization:: ORNL work for others

DOE Contract Number:: AC05-00OR22725

OSTI ID:: 1324086

Country of Publication:: United States

Language:: English

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