Imaging, cutting, and collecting instrument and method
Instrumentation and techniques are described to image small objects, such as but not limited to individual human chromosomes, with nanometer resolution. This instrument and method are also used to cut-off identified parts of objects, to move around and manipulate the cut-off parts on the substrate on which they are being imaged to predetermined locations on the substrate, and to remove the cut-off parts from the substrate. This is accomplished using an atomic force microscope (AFM) and by modification of the conventional cantilever stylus assembly of an AFM. The plural cantilevers are used with either sharp-tips or knife-edges. In addition, the invention can be utilized for measuring the hardness of materials. 10 figs.
- Research Organization:
- University of California
- DOE Contract Number:
- W-7405-ENG-48
- Assignee:
- Univ. of California, Oakland, CA (United States)
- Patent Number(s):
- US 5,461,907/A/
- Application Number:
- PAN: 8-035,741
- OSTI ID:
- 131909
- Country of Publication:
- United States
- Language:
- English
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