Robust microfabricated surface ion traps with arbitrary geometries.

Conference · Wed Jun 01 00:00:00 EDT 2011

OSTI ID:1289800

Moehring, David Lynn; Barrick, Todd Andrew; Benito, Francisco M.; Blain, Matthew Glenn; Cruz-Cabrera, Alvaro Augusto; Ellis, A. Robert; Fang, L.; Fortier, Kevin Michael; Haltli, Raymond A.; Highstrete, Clark; Kemme, Shanalyn A.; Lindgren, Thomas L.; Smith, M. E.; Sterk, Jonathan David; Stevens, J. E.; Stick, Daniel Lynn; Tabakov, Boyan P.; Tigges, Christopher P.; Descour, Michael R.

Abstract not provided.

• Research Organization: Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
• Sponsoring Organization: USDOE National Nuclear Security Administration (NNSA)
• DOE Contract Number: AC04-94AL85000
• OSTI ID: 1289800
• Report Number(s): SAND2011-4486C; 480875
• Country of Publication: United States
• Language: English