Improving the off-axis spatial resolution and dynamic range of the NIF X-ray streak cameras (invited)

MacPhee, A. G.; Dymoke-Bradshaw, A. K.  L.; Hares, J. D.; Hassett, J.; Hatch, B. W.; Meadowcroft, A. L.; Bell, P. M.; Bradley, D. K.; Datte, P. S.; Landen, O. L.; Palmer, N. E.; Piston, K. W.; Rekow, V. V.; Hilsabeck, T. J.; Kilkenny, J. D.

doi:10.1063/1.4960376

Title: Improving the off-axis spatial resolution and dynamic range of the NIF X-ray streak cameras (invited)

Journal Article · Mon Aug 08 00:00:00 EDT 2016 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.4960376· OSTI ID:1281694

^[1];

^[2];

^[2]; Hassett, J. ^[3]; Hatch, B. W. ^[1]; Meadowcroft, A. L. ^[4]; Bell, P. M. ^[1]; Bradley, D. K. ^[1]; Datte, P. S. ^[1];

^[1]; Palmer, N. E. ^[1]; Piston, K. W. ^[1]; Rekow, V. V. ^[1]; Hilsabeck, T. J. ^[5]; Kilkenny, J. D. ^[5]

Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Kentech Instruments Ltd, Oxfordshire (United Kingdom)
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States); Univ. of Rochester, NY (United States). Dept. of Electrical and Computer Engineering
AWE Aldermaston, Reading (United Kingdom)
General Atomics, San Diego, CA (United States)

Here, we report simulationsand experiments that demonstrate an increasein spatial resolution ofthe NIF core diagnostic x-ray streak camerasby a factor of two, especially off axis. A designwas achieved by usinga corrector electron optic to flatten the field curvature at the detector planeand corroborated by measurement. In addition, particle in cell simulations were performed to identify theregions in the streak camera that contribute most to space charge blurring. Our simulations provide a tool for convolving syntheticpre-shot spectra with the instrument functionso signal levels can be set to maximize dynamic range for the relevant part of the streak record.

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Research Organization:: Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)

Sponsoring Organization:: USDOE

Grant/Contract Number:: AC52-07NA27344

OSTI ID:: 1281694

Report Number(s):: LLNL-CONF-694392; RSINAK

Journal Information:: Review of Scientific Instruments, Vol. 87, Issue 11; Conference: Presented at: HTPD 2016, Madison, WI, United States, Jun 05 - Jun 09, 2016; ISSN 0034-6748

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 8 works

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References (9)

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Streaked radiography measurements of convergent ablator performance (invited) Hicks, D. G.; Spears, B. K.; Braun, D. G. Review of Scientific Instruments, Vol. 81, Issue 10 https://doi.org/10.1063/1.3475727	journal	October 2010
The National Ignition Facility Diagnostic Set at the Completion of the National Ignition Campaign, September 2012 Kilkenny, J. D.; Bell, P. M.; Bradley, D. K. Fusion Science and Technology, Vol. 69, Issue 1 https://doi.org/10.13182/FST15-173	journal	February 2016
The characterization of x‐ray photocathodes in the 0.1–10‐keV photon energy region Henke, B. . L.; Knauer, J. P.; Premaratne, K. Journal of Applied Physics, Vol. 52, Issue 3 https://doi.org/10.1063/1.329789	journal	March 1981
Evaluation of disturbing effect of mesh holes in wide-acceptance-angle electrostatic mesh lenses Matsuda, Hiroyuki; Tóth, László; Matsui, Fumihiko Journal of Electron Spectroscopy and Related Phenomena, Vol. 195 https://doi.org/10.1016/j.elspec.2014.05.013	journal	August 2014
Energy distribution and quantum yield for photoemission from air-contaminated gold surfaces under ultraviolet illumination close to the threshold Hechenblaikner, Gerald; Ziegler, Tobias; Biswas, Indro Journal of Applied Physics, Vol. 111, Issue 12 https://doi.org/10.1063/1.4730638	journal	June 2012
Applied Charged Particle Optics Liebl, Helmut Springer Berlin, Heidelberg https://doi.org/10.1007/978-3-540-71925-0	book	January 2008
The investigation of electron lenses Klemperer, O.; Wright, W. D. Proceedings of the Physical Society, Vol. 51, Issue 2 https://doi.org/10.1088/0959-5309/51/2/315	journal	March 1939
Applied charged particle optics Jerrard, H. G. Optics & Laser Technology, Vol. 13, Issue 3 https://doi.org/10.1016/0030-3992(81)90018-9	journal	June 1981

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