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Title: Real-Time Examination of Atomistic Mechanisms during Shock-Induced Structural Transformation in Silicon

Authors:
; ;
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1274768
Resource Type:
Journal Article
Resource Relation:
Journal Name: Physical Review Letters; Journal Volume: 117; Journal Issue: 4
Country of Publication:
United States
Language:
ENGLISH

Citation Formats

Turneaure, Stefan J., Sinclair, N., and Gupta, Y. M. Real-Time Examination of Atomistic Mechanisms during Shock-Induced Structural Transformation in Silicon. United States: N. p., 2016. Web. doi:10.1103/PhysRevLett.117.045502.
Turneaure, Stefan J., Sinclair, N., & Gupta, Y. M. Real-Time Examination of Atomistic Mechanisms during Shock-Induced Structural Transformation in Silicon. United States. doi:10.1103/PhysRevLett.117.045502.
Turneaure, Stefan J., Sinclair, N., and Gupta, Y. M. Fri . "Real-Time Examination of Atomistic Mechanisms during Shock-Induced Structural Transformation in Silicon". United States. doi:10.1103/PhysRevLett.117.045502.
@article{osti_1274768,
title = {Real-Time Examination of Atomistic Mechanisms during Shock-Induced Structural Transformation in Silicon},
author = {Turneaure, Stefan J. and Sinclair, N. and Gupta, Y. M.},
abstractNote = {},
doi = {10.1103/PhysRevLett.117.045502},
journal = {Physical Review Letters},
number = 4,
volume = 117,
place = {United States},
year = {Fri Jul 01 00:00:00 EDT 2016},
month = {Fri Jul 01 00:00:00 EDT 2016}
}
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