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Title: Contribution of dielectric screening to the total capacitance of few-layer graphene electrodes

Abstract

We apply joint density functional theory (JDFT), which treats the electrode/electrolyte interface self-consistently, to an electric double-layer capacitor (EDLC) based on few-layer graphene electrodes. The JDFT approach allows us to quantify a third contribution to the total capacitance beyond quantum capacitance (C Q) and EDL capacitance (C EDL). This contribution arises from the dielectric screening of the electric field by the surface of the few-layer graphene electrode, and we therefore term it the dielectric capacitance (C Dielec). We find that C Dielec becomes significant in affecting the total capacitance when the number of graphene layers in the electrode is more than three. In conclusion, our investigation sheds new light on the significance of the electrode dielectric screening on the capacitance of few-layer graphene electrodes.

Authors:
 [1];  [1]
  1. Univ. of California, Riverside, CA (United States)
Publication Date:
Research Org.:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
1267032
Grant/Contract Number:  
AC05-00OR22725
Resource Type:
Journal Article: Accepted Manuscript
Journal Name:
Journal of Physical Chemistry Letters
Additional Journal Information:
Journal Volume: 7; Journal Issue: 5; Journal ID: ISSN 1948-7185
Publisher:
American Chemical Society
Country of Publication:
United States
Language:
English
Subject:
37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY; 36 MATERIALS SCIENCE

Citation Formats

Zhan, Cheng, and Jiang, De-en. Contribution of dielectric screening to the total capacitance of few-layer graphene electrodes. United States: N. p., 2016. Web. doi:10.1021/acs.jpclett.6b00047.
Zhan, Cheng, & Jiang, De-en. Contribution of dielectric screening to the total capacitance of few-layer graphene electrodes. United States. doi:10.1021/acs.jpclett.6b00047.
Zhan, Cheng, and Jiang, De-en. Wed . "Contribution of dielectric screening to the total capacitance of few-layer graphene electrodes". United States. doi:10.1021/acs.jpclett.6b00047. https://www.osti.gov/servlets/purl/1267032.
@article{osti_1267032,
title = {Contribution of dielectric screening to the total capacitance of few-layer graphene electrodes},
author = {Zhan, Cheng and Jiang, De-en},
abstractNote = {We apply joint density functional theory (JDFT), which treats the electrode/electrolyte interface self-consistently, to an electric double-layer capacitor (EDLC) based on few-layer graphene electrodes. The JDFT approach allows us to quantify a third contribution to the total capacitance beyond quantum capacitance (CQ) and EDL capacitance (CEDL). This contribution arises from the dielectric screening of the electric field by the surface of the few-layer graphene electrode, and we therefore term it the dielectric capacitance (CDielec). We find that CDielec becomes significant in affecting the total capacitance when the number of graphene layers in the electrode is more than three. In conclusion, our investigation sheds new light on the significance of the electrode dielectric screening on the capacitance of few-layer graphene electrodes.},
doi = {10.1021/acs.jpclett.6b00047},
journal = {Journal of Physical Chemistry Letters},
issn = {1948-7185},
number = 5,
volume = 7,
place = {United States},
year = {2016},
month = {2}
}

Journal Article:
Free Publicly Available Full Text
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Cited by: 11 works
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