Current and surface charge modified hysteresis loops in ferroelectric thin films

Balke Wisinger, Nina; Jesse, Stephen; Maksymovych, Petro; Okatan, Mahmut Baris; Strelcov, Evgheni; Tselev, Alexander; Kalinin, Sergei

doi:10.1063/1.4927811

Title: Current and surface charge modified hysteresis loops in ferroelectric thin films

Journal Article · Wed Aug 19 00:00:00 EDT 2015 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.4927811· OSTI ID:1265701

Balke Wisinger, Nina ^[1]; Jesse, Stephen ^[1]; Maksymovych, Petro ^[1]; Okatan, Mahmut Baris ^[1]; Strelcov, Evgheni ^[1]; Tselev, Alexander ^[1]; Kalinin, Sergei ^[1]

Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)

Polarization domains in ferroelectric materials and the ability to orient them with an external electric field lead to the development of a variety of applications from information storage to actuation. The development of piezoresponse force microscopy (PFM) has enabled researchers to investigate ferroelectric domains and ferroelectric domain switching on the nanoscale, which offers a pathway to study structure-function relationships in this important material class. Due to its commercial availability and ease of use, PFM has become a widely used research tool. However, measurement artifacts, i.e., alternative signal origins besides the piezoelectric effect are barely discussed or considered. This becomes especially important for materials with a small piezoelectric coefficient or materials with unknown ferroelectric properties, including non-ferroelectric materials. Here, the role of surface charges and current flow during PFM measurements on classical ferroelectrics are discussed and it will be shown how they alter the PFM hysteresis loop shape. This will help to better address alternative signal origins in PFM-type experiments and offer a pathway to study additional phenomena besides ferroelectricity.

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Research Organization:: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)

Sponsoring Organization:: USDOE Office of Science (SC)

Grant/Contract Number:: AC05-00OR22725

OSTI ID:: 1265701

Journal Information:: Journal of Applied Physics, Vol. 118; ISSN 0021-8979

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 52 works

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Ferroelectric or non-ferroelectric: Why so many materials exhibit “ferroelectricity” on the nanoscale Vasudevan, Rama K.; Balke, Nina; Maksymovych, Peter Applied Physics Reviews, Vol. 4, Issue 2 https://doi.org/10.1063/1.4979015	journal	June 2017
Ferroelectric and piezoelectric properties of Hf _1-x Zr _x O ₂ and pure ZrO ₂ films Starschich, S.; Schenk, T.; Schroeder, U. Applied Physics Letters, Vol. 110, Issue 18 https://doi.org/10.1063/1.4983031	journal	May 2017
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Electrostatic contribution to hysteresis loop in piezoresponse force microscopy Qiao, Huimin; Seol, Daehee; Sun, Changhyo Applied Physics Letters, Vol. 114, Issue 15 https://doi.org/10.1063/1.5090591	journal	April 2019
Effect of surface charges on the polarization of BaTiO ₃ thin films investigated by UHV ‐ SPM Suzuki, Keigo; Hosokura, Tadasu; Okamoto, Takafumi Journal of the American Ceramic Society, Vol. 101, Issue 10 https://doi.org/10.1111/jace.15734	journal	May 2018
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