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Title: DABAM: An open-source database of X-ray mirrors metrology

Abstract

An open-source database containing metrology data for X-ray mirrors is presented. It makes available metrology data (mirror heights and slopes profiles) that can be used with simulation tools for calculating the effects of optical surface errors in the performances of an optical instrument, such as a synchrotron beamline. A typical case is the degradation of the intensity profile at the focal position in a beamline due to mirror surface errors. This database for metrology (DABAM) aims to provide to the users of simulation tools the data of real mirrors. The data included in the database are described in this paper, with details of how the mirror parameters are stored. An accompanying software is provided to allow simple access and processing of these data, calculate the most usual statistical parameters, and also include the option of creating input files for most used simulation codes. In conclusion, some optics simulations are presented and discussed to illustrate the real use of the profiles from the database.

Authors:
 [1];  [2];  [3];  [1];  [4];  [5];  [6];  [6];  [7];  [7];  [8];  [9];  [4];  [10];  [5];  [1];  [11]
  1. European Synchrotron Radiation Facility (ESRF), Grenoble (France)
  2. AC2T Research GmbH, Wiener Neustadt (Austria)
  3. SLAC National Accelerator Lab., Menlo Park, CA (United States)
  4. Brookhaven National Lab. (BNL), Upton, NY (United States)
  5. InSync Inc., Albuquerque, NM (United States)
  6. Elettra-Sincrotrone Trieste SCpA, Basovizza (Italy)
  7. Argonne National Lab. (ANL), Argonne, IL (United States)
  8. Helmholtz Zentrum Berlin, Berlin (Germany)
  9. Paul Scherrer Inst. (PSI), Villigen (Switzerland)
  10. Synchrotron Soleil (France)
  11. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Publication Date:
Research Org.:
SLAC National Accelerator Lab., Menlo Park, CA (United States); Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
1256312
Alternate Identifier(s):
OSTI ID: 1379294
Grant/Contract Number:  
AC02-76SF00515; AC02-05CH11231
Resource Type:
Journal Article: Accepted Manuscript
Journal Name:
Journal of Synchrotron Radiation (Online)
Additional Journal Information:
Journal Volume: 23; Journal Issue: 3; Journal ID: ISSN 1600-5775
Publisher:
International Union of Crystallography
Country of Publication:
United States
Language:
English
Subject:
97 MATHEMATICS AND COMPUTING; 96 KNOWLEDGE MANAGEMENT AND PRESERVATION; X-ray mirror; metrology; database; python statistics

Citation Formats

Sanchez del Rio, Manuel, Bianchi, Davide, Cocco, Daniele, Glass, Mark, Idir, Mourad, Metz, Jim, Raimondi, Lorenzo, Rebuffi, Luca, Reininger, Ruben, Shi, Xianbo, Siewert, Frank, Spielmann-Jaeggi, Sibylle, Takacs, Peter, Tomasset, Muriel, Tonnessen, Tom, Vivo, Amparo, and Yashchuk, Valeriy. DABAM: An open-source database of X-ray mirrors metrology. United States: N. p., 2016. Web. doi:10.1107/S1600577516005014.
Sanchez del Rio, Manuel, Bianchi, Davide, Cocco, Daniele, Glass, Mark, Idir, Mourad, Metz, Jim, Raimondi, Lorenzo, Rebuffi, Luca, Reininger, Ruben, Shi, Xianbo, Siewert, Frank, Spielmann-Jaeggi, Sibylle, Takacs, Peter, Tomasset, Muriel, Tonnessen, Tom, Vivo, Amparo, & Yashchuk, Valeriy. DABAM: An open-source database of X-ray mirrors metrology. United States. doi:10.1107/S1600577516005014.
Sanchez del Rio, Manuel, Bianchi, Davide, Cocco, Daniele, Glass, Mark, Idir, Mourad, Metz, Jim, Raimondi, Lorenzo, Rebuffi, Luca, Reininger, Ruben, Shi, Xianbo, Siewert, Frank, Spielmann-Jaeggi, Sibylle, Takacs, Peter, Tomasset, Muriel, Tonnessen, Tom, Vivo, Amparo, and Yashchuk, Valeriy. Sun . "DABAM: An open-source database of X-ray mirrors metrology". United States. doi:10.1107/S1600577516005014. https://www.osti.gov/servlets/purl/1256312.
@article{osti_1256312,
title = {DABAM: An open-source database of X-ray mirrors metrology},
author = {Sanchez del Rio, Manuel and Bianchi, Davide and Cocco, Daniele and Glass, Mark and Idir, Mourad and Metz, Jim and Raimondi, Lorenzo and Rebuffi, Luca and Reininger, Ruben and Shi, Xianbo and Siewert, Frank and Spielmann-Jaeggi, Sibylle and Takacs, Peter and Tomasset, Muriel and Tonnessen, Tom and Vivo, Amparo and Yashchuk, Valeriy},
abstractNote = {An open-source database containing metrology data for X-ray mirrors is presented. It makes available metrology data (mirror heights and slopes profiles) that can be used with simulation tools for calculating the effects of optical surface errors in the performances of an optical instrument, such as a synchrotron beamline. A typical case is the degradation of the intensity profile at the focal position in a beamline due to mirror surface errors. This database for metrology (DABAM) aims to provide to the users of simulation tools the data of real mirrors. The data included in the database are described in this paper, with details of how the mirror parameters are stored. An accompanying software is provided to allow simple access and processing of these data, calculate the most usual statistical parameters, and also include the option of creating input files for most used simulation codes. In conclusion, some optics simulations are presented and discussed to illustrate the real use of the profiles from the database.},
doi = {10.1107/S1600577516005014},
journal = {Journal of Synchrotron Radiation (Online)},
issn = {1600-5775},
number = 3,
volume = 23,
place = {United States},
year = {2016},
month = {5}
}

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Works referenced in this record:

X-ray optics simulation and beamline design using a hybrid method: diffraction-limited focusing mirrors
conference, September 2014

  • Shi, Xianbo; Reininger, Ruben; Sánchez del Río, Manuel
  • SPIE Optical Engineering + Applications, SPIE Proceedings
  • DOI: 10.1117/12.2061950

Diffraction-limited storage rings – a window to the science of tomorrow
journal, August 2014

  • Eriksson, Mikael; van der Veen, J. Friso; Quitmann, Christoph
  • Journal of Synchrotron Radiation, Vol. 21, Issue 5
  • DOI: 10.1107/S1600577514019286

Theory and practice of elliptically bent x-ray mirrors
journal, October 2000


Scanning deflectometric form measurement avoiding path-dependent angle measurement errors
journal, January 2010

  • Schulz, Michael; Ehret, Gerd; Fitzenreiter, Arne
  • Journal of the European Optical Society: Rapid Publications, Vol. 5
  • DOI: 10.2971/jeos.2010.10026

Characterization of the error budget of Alba-NOM
journal, May 2013

  • Nicolas, Josep; Martínez, Juan Carlos
  • Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 710
  • DOI: 10.1016/j.nima.2012.10.125

Approaching sub-50 nanoradian measurements by reducing the saw-tooth deviation of the autocollimator in the Nano-Optic-Measuring Machine
journal, June 2015

  • Qian, Shinan; Geckeler, Ralf D.; Just, Andreas
  • Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 785
  • DOI: 10.1016/j.nima.2015.02.065

A KB-Focusing Mirror Pair for a VUV-Raman Spectrometer at FLASH – Mirror Metrology and Ray Tracing Results
conference, January 2010

  • Siewert, Frank; Reininger, Ruben; Rübhausen, Michael A.
  • SRI 2009, 10TH INTERNATIONAL CONFERENCE ON RADIATION INSTRUMENTATION, AIP Conference Proceedings
  • DOI: 10.1063/1.3463320

Second metrology round-robin of APS, ESRF and SPring-8 laboratories of elliptical and spherical hard-x-ray mirrors
conference, September 2007

  • Rommeveaux, A.; Assoufid, L.; Ohashi, H.
  • Optical Engineering + Applications, SPIE Proceedings
  • DOI: 10.1117/12.736171

Requirements on hard x-ray grazing incidence optics for European XFEL: analysis and simulation of wavefront transformations
conference, May 2009

  • Samoylova, Liubov; Sinn, Harald; Siewert, Frank
  • SPIE Europe Optics + Optoelectronics, SPIE Proceedings
  • DOI: 10.1117/12.822251

Frequency responses and resolving power of numerical integration of sampled data
journal, January 2005


Reliable before-fabrication forecasting of expected surface slope distributions for x-ray optics
journal, April 2012


Ultra-precise characterization of LCLS hard X-ray focusing mirrors by high resolution slope measuring deflectometry
journal, January 2012

  • Siewert, Frank; Buchheim, Jana; Boutet, Sébastien
  • Optics Express, Vol. 20, Issue 4
  • DOI: 10.1364/OE.20.004525

Specification of x-ray mirrors in terms of system performance: new twist to an old plot
journal, February 2015

  • Yashchuk, Valeriy V.; Samoylova, Liubov V.; Kozhevnikov, Igor V.
  • Optical Engineering, Vol. 54, Issue 2
  • DOI: 10.1117/1.OE.54.2.025108

Relationship between Surface Scattering and Microtopographic Features
journal, April 1979

  • Church, E. L.; Jenkinson, H. A.; Zavada, J. M.
  • Optical Engineering, Vol. 18, Issue 2
  • DOI: 10.1117/12.7972337

ESAD shearing deflectometry: potentials for synchrotron beamline metrology
conference, August 2006


Application of the time-invariant linear filter approximation to parametrization of surface metrology with high-quality x-ray optics
journal, August 2014

  • Yashchuk, Valeriy V.; Tyurin, Yury N.; Tyurina, Anastasia Y.
  • Optical Engineering, Vol. 53, Issue 8
  • DOI: 10.1117/1.OE.53.8.084102

Wave-optical simulation of hard-x-ray nanofocusing by precisely figured elliptical mirrors
journal, January 2007

  • Kewish, Cameron M.; Assoufid, Lahsen; Macrander, Albert T.
  • Applied Optics, Vol. 46, Issue 11
  • DOI: 10.1364/AO.46.002010

Sub-microradian surface slope metrology with the ALS Developmental Long Trace Profiler
journal, May 2010

  • Yashchuk, Valeriy V.; Barber, Samuel; Domning, Edward E.
  • Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 616, Issue 2-3
  • DOI: 10.1016/j.nima.2009.10.175

Waviness effects in ray-tracing of “real” optical surfaces
journal, August 1992

  • del Río, M. Sánchez; Marcelli, A.
  • Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 319, Issue 1-3
  • DOI: 10.1016/0168-9002(92)90550-N

Comparison of two methods for simulation of hard X-ray nanofocusing by elliptical mirrors
journal, November 2007

  • Kewish, Cameron M.; Macrander, Albert T.; Assoufid, Lahsen
  • Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 582, Issue 1
  • DOI: 10.1016/j.nima.2007.08.141

Structured slope errors on real x-ray mirrors: ray tracing versus experiment
conference, November 1997

  • Signorato, Riccardo; Sanchez del Rio, Manuel
  • Optical Science, Engineering and Instrumentation '97, SPIE Proceedings
  • DOI: 10.1117/12.295553

A hybrid method for X-ray optics simulation: combining geometric ray-tracing and wavefront propagation
journal, May 2014

  • Shi, Xianbo; Reininger, Ruben; Sanchez del Rio, Manuel
  • Journal of Synchrotron Radiation, Vol. 21, Issue 4
  • DOI: 10.1107/S160057751400650X

The Diamond-NOM: A non-contact profiler capable of characterizing optical figure error with sub-nanometre repeatability
journal, May 2010

  • Alcock, S. G.; Sawhney, K. J. S.; Scott, S.
  • Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 616, Issue 2-3
  • DOI: 10.1016/j.nima.2009.10.137

Upgrade of long trace profiler for characterization of high-precision X-ray mirrors at SPring-8
journal, May 2010

  • Senba, Y.; Kishimoto, H.; Ohashi, H.
  • Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 616, Issue 2-3
  • DOI: 10.1016/j.nima.2009.12.007

A new SHADOW update: integrating diffraction effects into ray-tracing
conference, September 2014

  • Shi, Xianbo; Sanchez del Rio, Manuel; Reininger, Ruben
  • SPIE Optical Engineering + Applications, SPIE Proceedings
  • DOI: 10.1117/12.2061984

Propagation of coherent light pulses with PHASE
conference, September 2014

  • Bahrdt, J.; Flechsig, U.; Grizzoli, W.
  • SPIE Optical Engineering + Applications, SPIE Proceedings
  • DOI: 10.1117/12.2065228

Monte Carlo Calculation for Electromagnetic-Wave Scattering from Random Rough Surfaces
journal, May 1984


Sub-nm accuracy metrology for ultra-precise reflective X-ray optics
journal, April 2011

  • Siewert, F.; Buchheim, J.; Zeschke, T.
  • Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 635, Issue 1
  • DOI: 10.1016/j.nima.2010.10.137

Modeling of surface metrology of state-of-the-art x-ray mirrors as a result of stochastic polishing process
conference, November 2015

  • Yashchuk, Valeriy V.; Tyurin, Yury N.; Tyurina, Anastasia Y.
  • 12th International Conference on Correlation Optics, SPIE Proceedings
  • DOI: 10.1117/12.2218750

Design Of A Long Trace Surface Profiler
conference, April 1987

  • Takacs, Peter Z.; Qian, Shi-nan; Colbert, Jeffrey
  • OE LASE'87 and EO Imaging Symp (January 1987, Los Angeles), SPIE Proceedings
  • DOI: 10.1117/12.939842

Results of x-ray mirror round-robin metrology measurements at the APS, ESRF, and SPring-8 optical metrology laboratories
conference, August 2005

  • Assoufid, Lahsen; Rommeveaux, Amparo; Ohashi, Haruhiko
  • Optics & Photonics 2005, SPIE Proceedings
  • DOI: 10.1117/12.623209

Effect of slope errors on the performance of mirrors for x-ray free electron laser applications
journal, January 2015

  • Pardini, Tom; Cocco, Daniele; Hau-Riege, Stefan P.
  • Optics Express, Vol. 23, Issue 25
  • DOI: 10.1364/OE.23.031889

Time-dependent wave front propagation simulation of a hard x-ray split-and-delay unit: Towards a measurement of the temporal coherence properties of x-ray free electron lasers
journal, November 2014

  • Roling, S.; Zacharias, H.; Samoylova, L.
  • Physical Review Special Topics - Accelerators and Beams, Vol. 17, Issue 11
  • DOI: 10.1103/PhysRevSTAB.17.110705

Metrology, Mirrors and Gratings – Advances and Challenges in Synchrotron Optics
journal, March 2013


The Nanometer Optical Component Measuring Machine: a new Sub-nm Topography Measuring Device for X-ray Optics at BESSY
conference, January 2004

  • Siewert, Frank
  • SYNCHROTRON RADIATION INSTRUMENTATION: Eighth International Conference on Synchrotron Radiation Instrumentation, AIP Conference Proceedings
  • DOI: 10.1063/1.1757928

A proposal for an open source graphical environment for simulating x-ray optics
conference, September 2014

  • Sanchez del Rio, Manuel; Rebuffi, Luca; Demsar, Janez
  • SPIE Optical Engineering + Applications, SPIE Proceedings
  • DOI: 10.1117/12.2061834

First report on a European round robin for slope measuring profilers
conference, August 2005

  • Rommeveaux, Amparo; Thomasset, Muriel; Cocco, Daniele
  • Optics & Photonics 2005, SPIE Proceedings
  • DOI: 10.1117/12.621087

Fractal surface finish
journal, January 1988


Performance of the upgraded LTP-II at the ALS Optical Metrology Laboratory
conference, August 2008

  • Kirschman, Jonathan L.; Domning, Edward E.; McKinney, Wayne R.
  • Optical Engineering + Applications, SPIE Proceedings
  • DOI: 10.1117/12.796335

    Works referencing / citing this record:

    Wavefront-propagation simulations supporting the design of a time-delay compensating monochromator beamline at FLASH2
    journal, April 2019

    • Ruiz-Lopez, Mabel; Samoylova, Liubov; Brenner, Günter
    • Journal of Synchrotron Radiation, Vol. 26, Issue 3
    • DOI: 10.1107/s160057751900345x

    Wavefront-propagation simulations supporting the design of a time-delay compensating monochromator beamline at FLASH2
    journal, April 2019

    • Ruiz-Lopez, Mabel; Samoylova, Liubov; Brenner, Günter
    • Journal of Synchrotron Radiation, Vol. 26, Issue 3
    • DOI: 10.1107/s160057751900345x