Investigation of micro-electrical properties of Cu2ZnSnSe4 thin films using scanning probe microscopy

Jiang, C. -S.; Repins, I. L.; Beall, C.; Moutinho, H. R.; Ramanathan, K.; Al-Jassim, M. M.

doi:10.1016/j.solmat.2014.08.046

Title: Investigation of micro-electrical properties of Cu2ZnSnSe4 thin films using scanning probe microscopy

Journal Article · Thu Jan 01 00:00:00 EST 2015 · Solar Energy Materials and Solar Cells

DOI:https://doi.org/10.1016/j.solmat.2014.08.046· OSTI ID:1254668

Jiang, C. -S.; Repins, I. L.; Beall, C.; Moutinho, H. R.; Ramanathan, K.; Al-Jassim, M. M.

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Sponsoring Organization:: USDOE

OSTI ID:: 1254668

Journal Information:: Solar Energy Materials and Solar Cells, Journal Name: Solar Energy Materials and Solar Cells Vol. 132 Journal Issue: C; ISSN 0927-0248

Publisher:: ElsevierCopyright Statement

Country of Publication:: Netherlands

Language:: English

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Cited by: 22 works

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References (28)

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Indications of short minority-carrier lifetime in kesterite solar cells Repins, I. L.; Moutinho, H.; Choi, S. G. Journal of Applied Physics, Vol. 114, Issue 8 https://doi.org/10.1063/1.4819849	journal	August 2013
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