Detailed measurements and shaping of gate profiles for microchannel-plate-based X-ray framing cameras

Technical Report · Mon Oct 03 00:00:00 EDT 1994

DOI:https://doi.org/10.2172/125097· OSTI ID:125097

Landen, O L; Hammel, B A; Bell, P M ^[1]; Abare, A ^[1]; Bradley, D K ^[1]

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1. Lawrence Livermore National Lab., CA (United States)

Gated, microchannel-plate-based (MCP) framing cameras are increasingly used worldwide for x-ray imaging of subnanosecond laser-plasma phenomena. Large dynamic range (> 1,000) measurements of gain profiles for gated microchannel plates (MCP) are presented. Temporal profiles are reconstructed for any point on the microstrip transmission line from data acquired over many shots with variable delay. No evidence for significant pulse distortion by voltage reflections at the ends of the microstrip is observed. The measured profiles compare well to predictions by a time-dependent discrete dynode model down to the 1% level. The calculations do overestimate the contrast further into the temporal wings. The role of electron transit time dispersion in limiting the minimum achievable gate duration is then investigated by using variable duration flattop gating pulses. A minimum gate duration of 50 ps is achieved with flattop gating, consistent with a fractional transit time spread of {approx} 15%.

• Research Organization: Lawrence Livermore National Lab., CA (United States)
• Sponsoring Organization: USDOE, Washington, DC (United States)
• DOE Contract Number: W-7405-ENG-48
• OSTI ID: 125097
• Report Number(s): UCRL-JC--115937; CONF-940723--44; ON: DE96004019
• Country of Publication: United States
• Language: English

Related Subjects

70 PLASMA PHYSICS AND FUSION TECHNOLOGY
ELECTRON MULTIPLIERS
EXPERIMENTAL DATA
GAIN
GATING CIRCUITS
HOT PLASMA
INERTIAL CONFINEMENT
LASER IMPLOSIONS
PLASMA DIAGNOSTICS
PULSE SHAPERS
SIGNAL CONDITIONING
STREAK CAMERAS
THEORETICAL DATA
X-RAY DETECTION