Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Characterizing Switching Variability in TaOx Memristors.

Conference ·
OSTI ID:1248653
Abstract not provided.
Research Organization:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
DOE Contract Number:
AC04-94AL85000
OSTI ID:
1248653
Report Number(s):
SAND2015-2621C; 581971
Country of Publication:
United States
Language:
English

Similar Records

Characterizing Switching Variability in TaOx Resistive Memories.
Conference · Mon Jun 01 00:00:00 EDT 2015 · OSTI ID:1331607

Radiation Effects in TaOx Memristors.
Conference · Sun Jul 01 00:00:00 EDT 2012 · OSTI ID:1116793

The Effects of Ionizing Radiation on TaOx-based Memristors.
Conference · Sat Jan 31 23:00:00 EST 2015 · OSTI ID:1238219

Related Subjects