Large-angle illumination STEM: Toward three-dimensional atom-by-atom imaging

Ishikawa, Ryo; Lupini, Andrew R.; Hinuma, Yoyo; Pennycook, Stephen

doi:10.1016/j.ultramic.2014.11.009

Title: Large-angle illumination STEM: Toward three-dimensional atom-by-atom imaging

Journal Article · Wed Nov 26 00:00:00 EST 2014 · Ultramicroscopy

DOI:https://doi.org/10.1016/j.ultramic.2014.11.009· OSTI ID:1234990

Ishikawa, Ryo ^[1]; Lupini, Andrew R. ^[2]; Hinuma, Yoyo ^[3]; Pennycook, Stephen ^[4]

Univ. of Tokyo (Japan). Inst. of Engineering Innovation
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Materials Science & Technology Division
Kyoto Univ. (Japan). Dept. of Materials Science and Engineering
Univ. of Tennessee, Knoxville, TN (United States). Dept. of Materials Science and Engineering

To completely understand and control materials and their properties, it is of critical importance to determine their atomic structures in all three dimensions. Recent revolutionary advances in electron optics – the inventions of geometric and chromatic aberration correctors as well as electron source monochromators – have provided fertile ground for performing optical depth sectioning at atomic-scale dimensions. In this study we theoretically demonstrate the imaging of top/sub-surface atomic structures and identify the depth of single dopants, single vacancies and the other point defects within materials by large-angle illumination scanning transmission electron microscopy (LAI-STEM). The proposed method also allows us to measure specimen properties such as thickness or three-dimensional surface morphology using observations from a single crystallographic orientation.

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Research Organization:: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)

Sponsoring Organization:: USDOE Office of Science (SC)

Grant/Contract Number:: AC05-00OR22725; AC02- 05CH11231

OSTI ID:: 1234990

Alternate ID(s):: OSTI ID: 1247886

Journal Information:: Ultramicroscopy, Vol. 151; ISSN 0304-3991

Publisher:: ElsevierCopyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 36 works

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Theory-assisted determination of nano-rippling and impurities in atomic resolution images of angle-mismatched bilayer graphene Ovchinnikov, Oleg S.; O’Hara, Andrew; Nicholl, Ryan J. T. 2D Materials, Vol. 5, Issue 4 https://doi.org/10.1088/2053-1583/aadb5f	journal	September 2018
Microstructural Origins of High Piezoelectric Performance: A Pathway to Practical Lead‐Free Materials Wu, Haijun; Zhang, Yang; Wu, Jiagang Advanced Functional Materials, Vol. 29, Issue 33 https://doi.org/10.1002/adfm.201902911	journal	June 2019
Single atom visibility in STEM optical depth sectioning Ishikawa, Ryo; Pennycook, Stephen J.; Lupini, Andrew R. Applied Physics Letters, Vol. 109, Issue 16 https://doi.org/10.1063/1.4965709	journal	October 2016
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Title: Large-angle illumination STEM: Toward three-dimensional atom-by-atom imaging

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