Characterization of Novel Nanoscale Device Architectures using Current Mapping AFM.

Conference · Wed Apr 01 00:00:00 EDT 2015

OSTI ID:1246874

Howell, Stephen W.; Marinella, Matthew; Siegal, Michael P.; Friedman, Caitlin Anne Rochford; Decker, Seth; Hughart, David Russell; Yelton, William G.; Davids, Paul; Bogart, Gregory Robert; Dirk, Shawn M.

Abstract not provided.

• Research Organization: Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
• Sponsoring Organization: USDOE National Nuclear Security Administration (NNSA)
• DOE Contract Number: AC04-94AL85000
• OSTI ID: 1246874
• Report Number(s): SAND2015-2483PE; 579782
• Country of Publication: United States
• Language: English