Direct synchrotron x-ray measurements of local strain fields in elastically and plastically bent metallic glasses
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States); Univ. of Science and Technology Beijing, Beijing (China); Univ. of Tennessee, Knoxville, TN (United States)
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
- Argonne National Lab. (ANL), Argonne, IL (United States)
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States); Univ. of Tennessee, Knoxville, TN (United States)
In situ high-energy synchrotron X-ray diffraction was conducted on elastically and plastically bent bulk metallic glass (BMG) thin plates, from which distinct local elastic strain fields were mapped spatially. These directly measured residual strain fields can be nicely interpreted by our stress analysis, and also validate a previously proposed indirect residual-stress-measurement method by relating nanoindentation hardness to residual stresses. Local shear strain variations on the cross sections of these thin plates were found in the plastically bent BMG, which however cannot be determined from the indirect indentation method. As a result, this study has important implications in designing and manipulating internal strain fields in BMGs for the purpose of ductility enhancement.
- Research Organization:
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States); Argonne National Lab. (ANL), Argonne, IL (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC), Basic Energy Sciences (BES)
- Grant/Contract Number:
- AC05-00OR22725; AC02-06CH11357
- OSTI ID:
- 1238736
- Alternate ID(s):
- OSTI ID: 1245020; OSTI ID: 1250590
- Journal Information:
- Intermetallics, Vol. 67, Issue C; ISSN 0966-9795
- Publisher:
- ElsevierCopyright Statement
- Country of Publication:
- United States
- Language:
- English
Web of Science
Similar Records
Roles of nanoclusters in shear banding and plastic deformation of bulk metallic glasses
On capturing the grain-scale elastic and plastic anisotropy of alpha-Ti with spherical nanoindentation and electron back-scattered diffraction