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U.S. Department of Energy
Office of Scientific and Technical Information

Measurement modeling and simulation of cryogenic SiGe HBT amplifier circuits for fast single spin readout.

Conference ·
OSTI ID:1240331
Abstract not provided.
Research Organization:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
DOE Contract Number:
AC04-94AL85000
OSTI ID:
1240331
Report Number(s):
SAND2015-1378C; 567225
Country of Publication:
United States
Language:
English

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