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Title: Investigation of the Structural Stability of Ion-Implanted Gd2Ti2-xSnxO7 Pyrochlore-Type Oxides by Glancing Angle X-ray Absorption Spectroscopy

Journal Article · · Journal of Physical Chemistry. C
DOI:https://doi.org/10.1021/jp4095497· OSTI ID:1237719

Rare-earth titanate and stannate pyrochlore-type oxides have been investigated in the past for the sequestration of nuclear waste elements because of their resistance to radiation-induced structural damage. In order to enhance this property, it is necessary to understand the effect of radioactive decay of the incorporated actinide elements on the local chemical environment. In this study, Gd2Ti2–xSnxO7 materials have been implanted with Au– ions to simulate radiation-induced structural damage. Glancing angle X-ray absorption near-edge spectroscopy (GA-XANES), glancing angle X-ray absorption fine structure (GA-EXAFS) analysis, and powder X-ray diffraction have been used to investigate changes in the local coordination environment of the metal atoms in the damaged surface layer. Examination of GA-XANES/EXAFS spectra from the implanted Gd2Ti2–xSnxO7 materials collected at various glancing angles allowed for an investigation of how the local coordination environment around the absorbing atoms changed at different depths in the damaged surface layer. This study has shown the usefulness of GA-XANES to the examination of ion-implanted materials and has suggested that Gd2Ti2–xSnxO7 becomes more susceptible to ion-beam-induced structural damage with increasing Sn concentration.

Research Organization:
Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
Sponsoring Organization:
FOREIGN
OSTI ID:
1237719
Journal Information:
Journal of Physical Chemistry. C, Vol. 118, Issue (15) ; 04, 2014; ISSN 1932-7447
Country of Publication:
United States
Language:
ENGLISH