Electronic Structure of ClAlPc/pentacene/ITO Interfaces Studied by Using Soft X-ray Spectroscopy
Journal Article
·
· Journal of the Korean Physical Society
- Yonsei Univ., Wonju (Korea)
- Boston Univ., MA (United States)
The interfacial electronic structure of a bilayer of chloroaluminum phthalocyanine (ClAlPc) and pentacene grown on indium tin oxide (ITO) has been studied using synchrotron-radiation-excited photoelectron spectroscopy. The energy difference between the highest occupied molecular orbital (HOMO) level of the pentacene layer and the lowest unoccupied molecular orbital (LUMO) level of the ClAlPc layer (E HOMO D - E LUMO A ) was determined and compared with that of C60/pentacene bilayers. The E HOMO D - E LUMO A of a heterojunction with ClAlPc was found to be 1.3 eV while that with C60 was 0.9 eV. This difference is discussed in terms of the difference in the ionization energy of each acceptor materials. We also obtained the complete energy level diagrams of both ClAlPc/pentacene/ITO and C60/pentacene/ITO.
- Research Organization:
- Brookhaven National Laboratory (BNL), Upton, NY (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
- OSTI ID:
- 1229053
- Report Number(s):
- BNL--111128-2015-JA
- Journal Information:
- Journal of the Korean Physical Society, Journal Name: Journal of the Korean Physical Society Journal Issue: 10 Vol. 65; ISSN 0374-4884
- Publisher:
- Korean Physical Society
- Country of Publication:
- United States
- Language:
- English
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