Advantages of a Synchrotron Bending Magnet as the Sample Illuminator for a Wide-field X-ray Microscope
- Xradia, Pleasanton, CA (United States)
- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
In our paper the choice between bending magnets and insertion devices as sample illuminators for a hard X-ray full-field microscope is investigated. An optimized bending-magnet beamline design is presented. Its imaging speed is very competitive with the performance of similar microscopes installed currently at insertion-device beamlines. The fact that imaging X-ray microscopes can accept a large phase space makes them very well suited to the output characteristics of bending magnets which are often a plentiful and paid-for resource. There exist opportunities at all synchrotron light sources to take advantage of this finding to build bending-magnet beamlines that are dedicated to transmission X-ray microscope facilities. We expect that demand for such facilities will increase as three-dimensional tomography becomes routine and advanced techniques such as mosaic tomography and XANES tomography (taking three-dimensional tomograms at different energies to highlight elemental and chemical differences) become more widespread.
- Research Organization:
- Brookhaven National Lab. (BNL), Upton, NY (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC), Basic Energy Sciences (BES)
- DOE Contract Number:
- SC00112704
- OSTI ID:
- 1228907
- Report Number(s):
- BNL-110982-2015-JA
- Journal Information:
- Journal of Synchrotron Radiation, Vol. 19, Issue 5; ISSN 0909-0495
- Publisher:
- International Union of Crystallography
- Country of Publication:
- United States
- Language:
- English
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