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X-ray wavefront characterization with two-dimensional wavefront sensors: shearing interferometers and Hartmann wavefront sensors

Journal Article · Thu Jan 31 23:00:00 EST 2013 · Optical Engineering

DOI:https://doi.org/10.1117/1.OE.52.2.026501· OSTI ID:1224941

Baker, Kevin L.

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Research Organization:: Lawrence Livermore National Laboratory (LLNL), Livermore, CA

Sponsoring Organization:: USDOE

DOE Contract Number:: AC52-07NA27344

OSTI ID:: 1224941

Report Number(s):: LLNL-JRNL-618032

Journal Information:: Optical Engineering, Journal Name: Optical Engineering Journal Issue: 2 Vol. 52; ISSN 0091-3286

Publisher:: SPIE

Country of Publication:: United States

Language:: English

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