Interfacial dislocations in (111) oriented (Ba0.7Sr0.3)TiO3 films on SrTiO3 single crystal

Shen, Xuan; Yamada, Tomoaki; Lin, Ruoqian; Kamo, Takafumi; Funakubo, Hiroshi; Wu, Di; Xin, Huolin L.; Su, Dong

doi:10.1063/1.4932953

Title: Interfacial dislocations in (111) oriented (Ba_0.7Sr_0.3)TiO₃ films on SrTiO₃ single crystal

Journal Article · Thu Oct 08 00:00:00 EDT 2015 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.4932953· OSTI ID:1224766

Shen, Xuan ^[1]; Yamada, Tomoaki ^[2]; Lin, Ruoqian ^[3]; Kamo, Takafumi ^[4]; Funakubo, Hiroshi ^[4];

^[5]; Xin, Huolin L. ^[3];

^[3]

Nanjing Univ., Nanjing (China); Brookhaven National Lab., Upton, NY (United States)
Nagoya Univ., Nagoya (Japan); Japan Science and Technology Agency, Saitama (Japan); Tokyo Institute of Technology, Yokohama (Japan)
Brookhaven National Lab. (BNL), Upton, NY (United States)
Tokyo Institute of Technology, Yokohama (Japan)
Nanjing Univ., Nanjing (China)

In this study, we have investigated the interfacial structure of epitaxial (Ba,Sr)TiO₃ films grown on (111)-oriented SrTiO₃ single-crystal substrates using transmission electron microscopy (TEM) techniques. Compared with the (100) epitaxial perovskite films, we observe dominant dislocation half-loop with Burgers vectors of a<110> comprised of a misfit dislocation along <112>, and threading dislocations along <110> or <100>. The misfit dislocation with Burgers vector of a <110> can dissociate into two ½ a <110> partial dislocations and one stacking fault. We found the dislocation reactions occur not only between misfit dislocations, but also between threading dislocations. Via three-dimensional electron tomography, we retrieved the configurations of the threading dislocation reactions. The reactions between threading dislocations lead to a more efficient strain relaxation than do the misfit dislocations alone in the near-interface region of the (111)-oriented (Ba_0.7Sr_0.3)TiO₃ films.

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Research Organization:: Brookhaven National Laboratory (BNL), Upton, NY (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: SC00112704

OSTI ID:: 1224766

Report Number(s):: BNL-108487-2015-JA; APPLAB; KC0403020

Journal Information:: Applied Physics Letters, Vol. 107, Issue 14; ISSN 0003-6951

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 2 works

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References (34)

Origin of the dielectric dead layer in nanoscale capacitors Stengel, Massimiliano; Spaldin, Nicola A. Nature, Vol. 443, Issue 7112 https://doi.org/10.1038/nature05148	journal	October 2006
Impact of misfit dislocations on the polarization instability of epitaxial nanostructured ferroelectric perovskites Chu, Ming-Wen; Szafraniak, Izabela; Scholz, Roland Nature Materials, Vol. 3, Issue 2 https://doi.org/10.1038/nmat1057	journal	January 2004
Soft mode behavior in SrTiO3/DyScO3 thin films: Evidence of ferroelectric and antiferrodistortive phase transitions Nuzhnyy, D.; Petzelt, J.; Kamba, S. Applied Physics Letters, Vol. 95, Issue 23 https://doi.org/10.1063/1.3271179	journal	December 2009
Annealing effect on dislocations in SrTiO3∕LaAlO3 heterostructures Su, Dong; Yamada, Tomoaki; Sherman, Vladimir O. Journal of Applied Physics, Vol. 101, Issue 6 https://doi.org/10.1063/1.2710281	journal	March 2007
Atomic structure of Ba0.5Sr0.5TiO3 thin films on LaAlO3 Gao, H. -J.; Chen, C. L.; Rafferty, B. Applied Physics Letters, Vol. 75, Issue 17 https://doi.org/10.1063/1.125071	journal	October 1999
Misfit dislocation walls in solid films Ovid'ko, I. A. Journal of Physics: Condensed Matter, Vol. 11, Issue 34 https://doi.org/10.1088/0953-8984/11/34/304	journal	August 1999
Structural evolution of dislocation half-loops in epitaxial BaTiO3 thin films during high-temperature annealing Sun, H. P.; Pan, X. Q.; Haeni, J. H. Applied Physics Letters, Vol. 85, Issue 11 https://doi.org/10.1063/1.1789233	journal	September 2004
Structural and dielectric properties of strain-controlled epitaxial SrTiO3 thin films by two-step growth technique Yamada, Tomoaki; Astafiev, Konstantin F.; Sherman, Vladimir O. Journal of Applied Physics, Vol. 98, Issue 5 https://doi.org/10.1063/1.2037211	journal	September 2005
Analysis of misfit relaxation in heteroepitaxial BaTiO ₃ thin films Suzuki, Toshimasa; Nishi, Yuji; Fujimoto, Masayuki Philosophical Magazine A, Vol. 79, Issue 10 https://doi.org/10.1080/01418619908214294	journal	October 1999
Ferroelectric and antiferroelectric coupling in superlattices of paraelectric perovskites at room temperature Christen, Hans M.; Specht, Eliot D.; Silliman, Sherwood S. Physical Review B, Vol. 68, Issue 2 https://doi.org/10.1103/PhysRevB.68.020101	journal	July 2003
Epitaxial growth and dielectric properties of (111) oriented BaTiO3/SrTiO3 superlattices by pulsed-laser deposition Nakagawara, Osamu; Shimuta, Toru; Makino, Takahiro Applied Physics Letters, Vol. 77, Issue 20 https://doi.org/10.1063/1.1324985	journal	November 2000
Pressure-induced crossover from long-to-short-range order in [Pb(Zn1/3Nb2/3)O3]0.905(PbTiO3)0.095 single crystal Samara, G. A.; Venturini, E. L.; Schmidt, V. Hugo Applied Physics Letters, Vol. 76, Issue 10 https://doi.org/10.1063/1.126024	journal	March 2000
Dissociation and evolution of threading dislocations in epitaxial Ba0.3Sr0.7TiO3 thin films grown on (001) LaAlO3 Lu, C. J.; Bendersky, L. A.; Chang, K. Journal of Applied Physics, Vol. 93, Issue 1 https://doi.org/10.1063/1.1524315	journal	January 2003
Tuning of direct current bias-induced resonances in micromachined Ba0.3Sr0.7TiO3 thin-film capacitors Noeth, Andreas; Yamada, Tomoaki; Sherman, Vladimir O. Journal of Applied Physics, Vol. 102, Issue 11 https://doi.org/10.1063/1.2822203	journal	December 2007
High-resolution identification of ½⟨110⟩ stacking faults in epitaxial Ba _0.3 Sr _0.7 TiO ₃ thin films Lu, C. J.; Bendersky, L. A.; Chang, K. Philosophical Magazine, Vol. 83, Issue 13 https://doi.org/10.1080/1478643031000081284	journal	January 2003
Ferroelectric thin films: Review of materials, properties, and applications Setter, N.; Damjanovic, D.; Eng, L. Journal of Applied Physics, Vol. 100, Issue 5 https://doi.org/10.1063/1.2336999	journal	September 2006
Effective elastic properties for unpoled barium titanate Dent, A. C.; Bowen, C. R.; Stevens, R. Journal of the European Ceramic Society, Vol. 27, Issue 13-15 https://doi.org/10.1016/j.jeurceramsoc.2007.02.031	journal	January 2007
Movement of Dislocations Hull, D.; Bacon, D. J. Introduction to Dislocations https://doi.org/10.1016/B978-0-08-096672-4.00003-7	book	February 2011
Dependence of dielectric properties on internal stresses in epitaxial barium strontium titanate thin films Li, Hao; Roytburd, A. L.; Alpay, S. P. Applied Physics Letters, Vol. 78, Issue 16 https://doi.org/10.1063/1.1359141	journal	April 2001
Effects of very thin strain layers on dielectric properties of epitaxial Ba0.6Sr0.4TiO3 films Park, B. H.; Peterson, E. J.; Jia, Q. X. Applied Physics Letters, Vol. 78, Issue 4 https://doi.org/10.1063/1.1340863	journal	January 2001
Optimization of the tunability of barium strontium titanate films via epitaxial stresses Ban, Z. -G.; Alpay, S. P. Journal of Applied Physics, Vol. 93, Issue 1 https://doi.org/10.1063/1.1524310	journal	January 2003
Calculation of critical layer thickness versus lattice mismatch for Ge _x Si _{1− x} /Si strained‐layer heterostructures People, R.; Bean, J. C. Applied Physics Letters, Vol. 47, Issue 3 https://doi.org/10.1063/1.96206	journal	August 1985
Phase diagrams and dielectric response of epitaxial barium strontium titanate films: A theoretical analysis Ban, Z. -G.; Alpay, S. P. Journal of Applied Physics, Vol. 91, Issue 11 https://doi.org/10.1063/1.1473675	journal	June 2002
Dielectric properties in heteroepitaxial Ba0.6Sr0.4TiO3 thin films: Effect of internal stresses and dislocation-type defects Canedy, C. L.; Li, Hao; Alpay, S. P. Applied Physics Letters, Vol. 77, Issue 11 https://doi.org/10.1063/1.1308531	journal	September 2000
Misfit dislocations in nanoscale ferroelectric heterostructures Nagarajan, V.; Jia, C. L.; Kohlstedt, H. Applied Physics Letters, Vol. 86, Issue 19 https://doi.org/10.1063/1.1922579	journal	May 2005
Origin of 90° domain wall pinning in Pb(Zr _0.2 Ti _0.8 )O ₃ heteroepitaxial thin films Su, Dong; Meng, Qingping; Vaz, C. A. F. Applied Physics Letters, Vol. 99, Issue 10 https://doi.org/10.1063/1.3634028	journal	September 2011
Study of Microstructure in SrTiO ₃ /Si by High-resolution Transmission Electron Microscopy Yang, G. Y.; Finder, J. M.; Wang, J. Journal of Materials Research, Vol. 17, Issue 1 https://doi.org/10.1557/JMR.2002.0030	journal	January 2002
Growth-mode induced defects in epitaxial SrTiO ₃ thin films grown on single crystal LaAlO ₃ by a two-step PLD process Su, Dong; Yamada, Tomoaki; Gysel, Roman Journal of Materials Research, Vol. 26, Issue 6 https://doi.org/10.1557/jmr.2010.82	journal	March 2011
Transitions from Near-Surface to Interior Redox upon Lithiation in Conversion Electrode Materials He, Kai; Xin, Huolin L.; Zhao, Kejie Nano Letters, Vol. 15, Issue 2 https://doi.org/10.1021/nl5049884	journal	January 2015
Strong growth orientation dependence of strain relaxation in epitaxial (Ba,Sr)TiO ₃ films and the resulting dielectric properties Yamada, Tomoaki; Kamo, Takafumi; Funakubo, Hiroshi Journal of Applied Physics, Vol. 109, Issue 9 https://doi.org/10.1063/1.3581203	journal	May 2011
Three-dimensional analysis of dislocation networks in GaN using weak-beam dark-field electron tomography Barnard, J. S.; Sharp, J.; Tong, J. R. Philosophical Magazine, Vol. 86, Issue 29-31 https://doi.org/10.1080/14786430600798839	journal	October 2006
Dislocations in SrTiO ₃ thin films grown on LaAlO ₃ substrates Qin, Y. L.; Jia, C. L.; Urban, K. Journal of Materials Research, Vol. 17, Issue 12 https://doi.org/10.1557/JMR.2002.0451	journal	December 2002
Interfacial structure in epitaxial perovskite oxides on (001) Ge crystal Shen, Xuan; Ahmadi-Majlan, K.; Ngai, Joseph H. Applied Physics Letters, Vol. 106, Issue 3 https://doi.org/10.1063/1.4906430	journal	January 2015
In situ high-resolution transmission electron microscopy of dislocation formation and dynamics during the crystallization of amorphous SrTiO3 Lee, Sung Bo; Sigle, Wilfried; Phillipp, Fritz Acta Materialia, Vol. 53, Issue 6 https://doi.org/10.1016/j.actamat.2004.12.034	journal	April 2005

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Title: Interfacial dislocations in (111) oriented (Ba0.7Sr0.3)TiO3 films on SrTiO3 single crystal

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