Layer-rigidity model and the mechanism for ion-diffusion-controlled kinetics in the bismuth cuprate 2212-to-2223 transformation
Journal Article
·
· Physical Review, B: Condensed Matter
- Department of Applied Science, Building 480, Brookhaven National Laboratory, P. O. Box 5000, Upton, New York 11973-5000 (United States)
Recent transmission electron microscopy (TEM) experiments have shown that the transformation of the Bi cuprate 2212 phase to 2223 phase consists of fast growth of Ca/CuO{sub 2} planes in the Bi-2212 matrix. A theory is proposed which considers the cylindrical void created by the edge dislocation due to the insertion of a Ca/CuO{sub 2} plane to be a channel for fast ion diffusion. A layer-rigidity model is used to estimate the size of the void for Bi-2212/Bi-2223, as well as that for the stacking fault created by heavy-ion irradiation in YBa{sub 2}Cu{sub 3}O{sub 7} (YBCO) compounds. We find the predictions of the model to agree quantitatively with TEM measurements of the structures of ion-irradiated YBCO systems. The calculated void size for Bi-2212/Bi-2223 compounds is consistent with the existence of fast ion diffusion along the {ital ab} plane. The experimentally observed time dependence of the volume fraction of Bi-2223 during the transformation is found to be consistent with a one-dimensional diffusion-controlled transformation mechanism, as predicted by our model.
- Research Organization:
- Brookhaven National Laboratory
- DOE Contract Number:
- AC02-76CH00016
- OSTI ID:
- 122324
- Journal Information:
- Physical Review, B: Condensed Matter, Journal Name: Physical Review, B: Condensed Matter Journal Issue: 17 Vol. 52; ISSN 0163-1829; ISSN PRBMDO
- Country of Publication:
- United States
- Language:
- English
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