Josephson frequency meter for millimeter and submillimeter wavelengths
- State Research Center, Kiev (Ukraine); and others
Frequency measurements of electromagnetic oscillations of millimeter and submillimeter wavebands with frequency growth due to a number of reasons become more and more difficult. First, these frequencies are considered to be cutoff for semiconductor converting devices and one has to use optical measurement methods instead of traditional ones with frequency transfer. Second, resonance measurement methods are characterized by using relatively narrow bands and optical ones are limited in frequency and time resolution due to the limited range and velocity of movement of their mechanical elements as well as the efficiency of these optical techniques decreases with the increase of wavelength due to diffraction losses. That requires the apriori information on the radiation frequency band of the source involved. Method of measuring frequency of harmonic microwave signals in millimeter and submillimeter wavebands based on the ac Josephson effect in superconducting contacts is devoid of all the above drawbacks. This approach offers a number of major advantages over the more traditional measurement methods, that is the one based on frequency conversion, resonance and interferrometric techniques. It can be characterized by high potential accuracy, wide range of frequencies measured, prompt measurement and the opportunity to obtain panoramic display of the results as well as full automation of the measuring process.
- Research Organization:
- National Aeronautics and Space Administration, Washington, DC (United States); National Aeronautics and Space Administration, Houston, TX (United States). Lyndon B. Johnson Space Center
- OSTI ID:
- 121647
- Report Number(s):
- CONF-940627--Vol.2; ON: TI95017155
- Country of Publication:
- United States
- Language:
- English
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