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Title: Fresnel zone plate stacking in the intermediate field for high efficiency focusing in the hard X-ray regime

Journal Article · · Optics Express
DOI:https://doi.org/10.1364/OE.22.028142· OSTI ID:1212373
 [1];  [1];  [1];  [1];  [1];  [2];  [3];  [1];  [1];  [1]
  1. Argonne National Lab. (ANL), Argonne, IL (United States)
  2. Argonne National Lab. (ANL), Argonne, IL (United States); Diamond Light Source, Ltd., Didcot - Oxfordshire (United Kingdom). Harwell Science and Innovation Campus.
  3. Northwestern Univ., Evanston, IL (United States)

Focusing efficiency of Fresnel zone plates (FZPs) for X-rays depends on zone height, while the achievable spatial resolution depends on the width of the finest zones. FZPs with optimal efficiency and sub-100-nm spatial resolution require high aspect ratio structures which are difficult to fabricate with current technology especially for the hard X-ray regime. A possible solution is to stack several zone plates. To increase the number of FZPs within one stack, we first demonstrate intermediate-field stacking and apply this method by stacks of up to five FZPs with adjusted diameters. Approaching the respective optimum zone height, we maximized efficiencies for high resolution focusing at three different energies, 10, 11.8, and 25 keV.

Research Organization:
Argonne National Laboratory (ANL), Argonne, IL (United States)
Sponsoring Organization:
USDOE Office of Science (SC)
Grant/Contract Number:
AC02-06CH11357
OSTI ID:
1212373
Journal Information:
Optics Express, Vol. 22, Issue 23; ISSN 1094-4087
Publisher:
Optical Society of America (OSA)Copyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 16 works
Citation information provided by
Web of Science

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Cited By (5)

3D Nanofabrication of High-Resolution Multilayer Fresnel Zone Plates journal June 2018
X-ray Microscopy book January 2019
Interlaced zone plate optics for hard X-ray imaging in the 10 nm range journal March 2017
Ultimate limitations in the performance of kinoform lenses for hard x-ray focusing journal January 2019
X-ray microscopy journal July 1965

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