X-ray microscopy. Beyond ensemble averages
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Materials Science & Technology Division
This work exemplifies emerging tools to characterize local materials structure and dynamics, made possible by powerful X-ray synchrotron and transmission electron microscopy methods.
- Research Organization:
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC)
- Grant/Contract Number:
- AC05-00OR22725
- OSTI ID:
- 1210156
- Journal Information:
- Nature Materials, Vol. 14, Issue 7; ISSN 1476-1122
- Publisher:
- Nature Publishing GroupCopyright Statement
- Country of Publication:
- United States
- Language:
- English
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