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Plastic Deformation in Profile-Coated Elliptical KB Mirrors

Journal Article · · ISRN Optics
DOI:https://doi.org/10.5402/2012/151092· OSTI ID:1197880
 [1];  [2];  [1];  [3];  [1];  [1];  [1];  [4];  [1]
  1. X-ray Science Division, Argonne National Laboratory, Argonne, IL 60439, USA
  2. National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY 11973, USA
  3. Synchrotron Soleil, BP 48 Saint-Aubin, 91192 Gif-sur-Yvette, France
  4. Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA

Profile coating has been successfully applied to produce elliptical Kirkpatrick-Baez (KB) mirrors using both cylindrical and flat Si substrates. Previously, focusing widths of 70 nm with 15-keV monochromatic and 80 nm with white beam were achieved using a flat Si substrate. Now, precision elliptical KB mirrors with sub-nm figure errors are produced with both Au and Pt coatings on flat substrates. Recent studies of bare Si-, Au-, and Pt-coated KB mirrors under prolonged synchrotron X-ray radiation and low-temperature vacuum annealing will be discussed in terms of film stress relaxation and Si plastic deformation.

Sponsoring Organization:
USDOE
Grant/Contract Number:
AC02-06CH11357
OSTI ID:
1197880
Alternate ID(s):
OSTI ID: 1052266
Journal Information:
ISRN Optics, Journal Name: ISRN Optics Vol. 2012; ISSN 2090-7826
Publisher:
Hindawi (International Scholarly Research Network)Copyright Statement
Country of Publication:
Egypt
Language:
English

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Residual stress and microstructure of as-deposited and annealed, sputtered yttria-stabilized zirconia thin films journal March 2008

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