Principles of femtosecond X-ray/optical cross-correlation with X-ray induced transient optical reflectivity in solids

Journal Article · Tue Feb 10 00:00:00 EST 2015 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.4907949· OSTI ID:1194689

Eckert, S. ^[1]; Beye, M.  ^[1]; Pietzsch, A.  ^[1]; Quevedo, W. ^[1]; Hantschmann, M. ^[1]; Ochmann, M. ^[2]; Ross, M.  ^[3]; Minitti, M. P. ^[4]; Turner, J. J. ^[4]; Moeller, S. P.  ^[4]; Schlotter, W. F. ^[4]; Dakovski, G. L. ^[4]; Khalil, M. ^[3]; Huse, N. ^[2]; Föhlisch, A. ^[5]

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1. Institute for Methods and Instrumentation in Synchrotron Radiation Research, Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Albert-Einstein-Str. 15, 12489 Berlin, Germany
2. Institute for Nanostructure and Solid State Physics, University of Hamburg, Jungiusstr. 11, 20355 Hamburg, Germany and Max Planck Institute for the Structure and Dynamics of Matter, Center for Free-Electron Laser Science, Luruper Chaussee 149, 22761 Hamburg, Germany
3. Department of Chemistry, University of Washington, Box 351700, Seattle, Washington 98195, USA
4. LCLS, SLAC National Accelerator Laboratory, 2575 Sand Hill Road, Menlo Park, California 94025, USA
5. Institute for Methods and Instrumentation in Synchrotron Radiation Research, Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Albert-Einstein-Str. 15, 12489 Berlin, Germany; Institut für Physik und Astronomie, Universität Potsdam, Karl-Liebknecht-Str. 24/25, 14476 Potsdam, Germany

Abstract is Provided

• Research Organization: SLAC National Accelerator Lab., Menlo Park, CA (United States)
• Sponsoring Organization: USDOE Office of Science (SC)
• DOE Contract Number: SC0002190; AC03-76SF00515
• OSTI ID: 1194689
• Journal Information: Applied Physics Letters, Vol. 106, Issue 6; ISSN 0003-6951: APPLAB
• Country of Publication: United States
• Language: English