Texture and transport in spray pyrolyzed TlBa{sub 2}Ca{sub 2}Cu{sub 3}O{sub 9} thick films
Journal Article
·
· Journal of Materials Research
- General Electric Research and Development, Schenectady, New York 12301 (United States)
- Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831 (United States)
The electron backscattering pattern technique has been applied to the microstructural investigation of Tl(1223) thick films formed by vapor-phase thallination of Ag-containing Ba--Ca--Cu--oxide precursors. For samples grown on polycrystalline YSZ, considerable biaxial alignment is found in localized, multigrain regions as wide as 100 {mu}m or more. However, on scales above 1 mm the overall texture remains only uniaxial with the c-axes (i.e. [001]) aligned perpendicular to the plane of the substrate. On single-crystal KTaO{sub 3} an epitaxial relationship is evident which persists to the surface of a 3 {mu}m thick film. Modest variations in the processing protocol yield films containing grains oriented with the {ital c}-axis in the plane, resulting in the degradation of transport properties. The data suggest a growth model in which sparse nucleation occurs at the substrate followed by rapid lateral crystallization.
- Research Organization:
- Oak Ridge National Laboratory
- DOE Contract Number:
- AC05-84OR21400
- OSTI ID:
- 119410
- Journal Information:
- Journal of Materials Research, Journal Name: Journal of Materials Research Journal Issue: 9 Vol. 10; ISSN JMREEE; ISSN 0884-2914
- Country of Publication:
- United States
- Language:
- English
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