Secondary Ion Mass Spectrometry for Mg Tracer Diffusion: Issues and Solutions
Conference
·
OSTI ID:1185379
- Virginia Polytechnic Institute and State University
- ORNL
- University of Central Florida
A Secondary Ion Mass Spectrometry (SIMS) method has been developed to measure stable Mg isotope tracer diffusion. This SIMS method was then used to calculate Mg self- diffusivities and the data was verified against historical data measured using radio tracers. The SIMS method has been validated as a reliable alternative to the radio-tracer technique for the measurement of Mg self-diffusion coefficients and can be used as a routine method for determining diffusion coefficients.
- Research Organization:
- Oak Ridge National Laboratory (ORNL)
- Sponsoring Organization:
- EE USDOE - Office of Energy Efficiency and Renewable Energy (EE)
- DOE Contract Number:
- AC05-00OR22725
- OSTI ID:
- 1185379
- Country of Publication:
- United States
- Language:
- English
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