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U.S. Department of Energy
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Secondary Ion Mass Spectrometry for Mg Tracer Diffusion: Issues and Solutions

Conference ·
OSTI ID:1185379

A Secondary Ion Mass Spectrometry (SIMS) method has been developed to measure stable Mg isotope tracer diffusion. This SIMS method was then used to calculate Mg self- diffusivities and the data was verified against historical data measured using radio tracers. The SIMS method has been validated as a reliable alternative to the radio-tracer technique for the measurement of Mg self-diffusion coefficients and can be used as a routine method for determining diffusion coefficients.

Research Organization:
Oak Ridge National Laboratory (ORNL)
Sponsoring Organization:
EE USDOE - Office of Energy Efficiency and Renewable Energy (EE)
DOE Contract Number:
AC05-00OR22725
OSTI ID:
1185379
Country of Publication:
United States
Language:
English

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