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Title: A Power Hardware-in-the-Loop Platform with Remote Distribution Circuit Cosimulation

Journal Article · · IEEE Transactions on Industrial Electronics, 62(4):2236-2245

This paper demonstrates the use of a novel cosimulation architecture that integrates hardware testing using Power Hardware-in-the-Loop (PHIL) with larger-scale electric grid models using off-the-shelf, non-PHIL software tools. This architecture enables utilities to study the impacts of emerging energy technologies on their system and manufacturers to explore the interactions of new devices with existing and emerging devices on the power system, both without the need to convert existing grid models to a new platform or to conduct in-field trials. The paper describes an implementation of this architecture for testing two residential-scale advanced solar inverters at separate points of common coupling. The same hardware setup is tested with two different distribution feeders (IEEE 123 and 8500 node test systems) modeled using GridLAB-D. In addition to simplifying testing with multiple feeders, the architecture demonstrates additional flexibility with hardware testing in one location linked via the Internet to software modeling in a remote location. In testing, inverter current, real and reactive power, and PCC voltage are well captured by the co-simulation platform. Testing of the inverter advanced control features is currently somewhat limited by the software model time step (1 sec) and tested communication latency (24 msec). Overshoot induced oscillations are observed with volt/VAR control delays of 0 and 1.5 sec, while 3.4 sec and 5.5 sec delays produced little or no oscillation. These limitations could be overcome using faster modeling and communication within the same co-simulation architecture.

Research Organization:
Pacific Northwest National Lab. (PNNL), Richland, WA (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC05-76RL01830
OSTI ID:
1177711
Report Number(s):
PNNL-SA-101437
Journal Information:
IEEE Transactions on Industrial Electronics, 62(4):2236-2245, Journal Name: IEEE Transactions on Industrial Electronics, 62(4):2236-2245
Country of Publication:
United States
Language:
English