Photoionization mass spectrometry of F₂O

Journal Article · Mon Jan 01 04:00:00 EST 1973 · Journal of Chemical Physics

DOI:https://doi.org/10.1063/1.1680115· OSTI ID:1169741

Berkowitz, J. ^[1]; Dehmer, Patricia M. ^[1]; Chupka, W. A. ^[1]

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1. Argonne National Laboratory (ANL), Argonne, IL (United States)

The photoionization efficiencies of the ions F₂O⁺ and OF⁺ have been measured in a photoionization mass spectrometric study of F₂O. The adiabatic first ionization potential of F₂O is determined to be 13.11 ± 0.01 eV. The region near threshold (13.11–13.6 eV) has structure that is interpreted as vibrational autoionization. Additional peaks at 13.81, ~ 15, and ~ 15.5 eV are interpreted as Rydberg levels that decay by an electronic autoionization mechanism and which converge to the second ionization potential at 16.17 eV. An upper limit for the appearance potential of OF⁺(0°K) is found to be 14.438 eV, grossly different from the electron impact value of 15.8 ± 0.2 eV. The current result implies Δ H°(_f0)(OF)=+26.1 ± 2.3 kcal/mole and I.P.(OF)=12.7₉± 0.1₀ eV.

• Research Organization: Argonne National Laboratory (ANL), Argonne, IL (United States)
• Sponsoring Organization: US Atomic Energy Commission (AEC)
• DOE Contract Number: W-31109-ENG-38
• OSTI ID: 1169741
• Journal Information: Journal of Chemical Physics, Journal Name: Journal of Chemical Physics Journal Issue: 2 Vol. 59; ISSN JCPSA6; ISSN 0021-9606
• Publisher: American Institute of Physics (AIP)
• Country of Publication: United States
• Language: English

Related Subjects

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
74 ATOMIC AND MOLECULAR PHYSICS