High temperature thermoreflectance imaging and transient Harman characterization of thermoelectric energy conversion devices

Favaloro, T.; Ziabari, A.; Bahk, J. H.; Burke, P.; Lu, H.; Bowers, J.; Gossard, A.; Bian, Z.; Shakouri, A.

doi:10.1063/1.4885198

Title: High temperature thermoreflectance imaging and transient Harman characterization of thermoelectric energy conversion devices

Journal Article · Mon Jul 21 00:00:00 EDT 2014 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.4885198· OSTI ID:1168210

Favaloro, T.; Ziabari, A.; Bahk, J. H.; Burke, P.; Lu, H.; Bowers, J.; Gossard, A.; Bian, Z.; Shakouri, A.

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Research Organization:: Energy Frontier Research Centers (EFRC) (United States). Center for Energy Efficient Materials (CEEM)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

DOE Contract Number:: SC0001009

OSTI ID:: 1168210

Journal Information:: Journal of Applied Physics, Vol. 116; Related Information: CEEM partners with the University of California, Santa Barbara (lead); Purdue University; Los Alamos National Laboratory; National Renewable Energy Laboratory

Country of Publication:: United States

Language:: English

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Thermoreflectance imaging of electromigration evolution in asymmetric aluminum constrictions Tian, Hao; Ahn, Woojin; Maize, Kerry Journal of Applied Physics, Vol. 123, Issue 3 https://doi.org/10.1063/1.5005938	journal	January 2018

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