Systems and methods for sample analysis
Patent
·
OSTI ID:1167213
The invention generally relates to systems and methods for sample analysis. In certain embodiments, the invention provides a system for analyzing a sample that includes a probe including a material connected to a high voltage source, a device for generating a heated gas, and a mass analyzer.
- Research Organization:
- Purdue Research Foundation, West Lafayette, IN (United States)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- FG02-06ER15807
- Assignee:
- Purdue Research Foundation (West Lafayette, IN)
- Patent Number(s):
- 8,932,875
- Application Number:
- 13/977,758
- OSTI ID:
- 1167213
- Country of Publication:
- United States
- Language:
- English
Electrospray: Principles and Practice
|
journal | July 1997 |
Ionic liquid ion sources: characterization of externally wetted emitters
|
journal | February 2005 |
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