skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Fast electron microscopy via compressive sensing

Abstract

Various technologies described herein pertain to compressive sensing electron microscopy. A compressive sensing electron microscope includes a multi-beam generator and a detector. The multi-beam generator emits a sequence of electron patterns over time. Each of the electron patterns can include a plurality of electron beams, where the plurality of electron beams is configured to impart a spatially varying electron density on a sample. Further, the spatially varying electron density varies between each of the electron patterns in the sequence. Moreover, the detector collects signals respectively corresponding to interactions between the sample and each of the electron patterns in the sequence.

Inventors:
; ;
Publication Date:
Research Org.:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1165123
Patent Number(s):
8,907,280
Application Number:
13/622,943
Assignee:
Sandia Corporation (Albuquerque, NM) SSO
DOE Contract Number:  
AC04-94AL85000
Resource Type:
Patent
Resource Relation:
Patent File Date: 2012 Sep 19
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

Larson, Kurt W, Anderson, Hyrum S, and Wheeler, Jason W. Fast electron microscopy via compressive sensing. United States: N. p., 2014. Web.
Larson, Kurt W, Anderson, Hyrum S, & Wheeler, Jason W. Fast electron microscopy via compressive sensing. United States.
Larson, Kurt W, Anderson, Hyrum S, and Wheeler, Jason W. Tue . "Fast electron microscopy via compressive sensing". United States. https://www.osti.gov/servlets/purl/1165123.
@article{osti_1165123,
title = {Fast electron microscopy via compressive sensing},
author = {Larson, Kurt W and Anderson, Hyrum S and Wheeler, Jason W},
abstractNote = {Various technologies described herein pertain to compressive sensing electron microscopy. A compressive sensing electron microscope includes a multi-beam generator and a detector. The multi-beam generator emits a sequence of electron patterns over time. Each of the electron patterns can include a plurality of electron beams, where the plurality of electron beams is configured to impart a spatially varying electron density on a sample. Further, the spatially varying electron density varies between each of the electron patterns in the sequence. Moreover, the detector collects signals respectively corresponding to interactions between the sample and each of the electron patterns in the sequence.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Dec 09 00:00:00 EST 2014},
month = {Tue Dec 09 00:00:00 EST 2014}
}

Patent:

Save / Share:

Works referenced in this record: