Decay Paths of Interfering Two-Electron Excitations in Helium
Journal Article
·
· Physical Review Letters
- Department of Physics, University of Central Florida, Orlando, Florida 32816-2385 (United States)
- Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6201 (United States)
- Institute of Physical and Chemical Research (RIKEN), Wako, Saitama 351-01 (Japan)
Partial photoionization cross sections and photoelectron angular distributions of He in the region of interfering Rydberg series below the {ital n}=5 threshold are measured and compared with theoretical results based on the hyperspherical close-coupling method. At a bandpass of 12 meV for the photon energy, this level of differentiation offers the most critical assessment of the dynamics of the two-electron excitations to date. A good understanding is achieved.
- Research Organization:
- Oak Ridge National Laboratory
- DOE Contract Number:
- AC05-84OR21400; AC03-76SF00098
- OSTI ID:
- 116004
- Journal Information:
- Physical Review Letters, Journal Name: Physical Review Letters Journal Issue: 8 Vol. 75; ISSN 0031-9007; ISSN PRLTAO
- Country of Publication:
- United States
- Language:
- English
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