Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Single Event upset (SEU) Testing with the Sandia Ion-photon Emission Microscope (IPEM).

Conference ·
OSTI ID:1147587

Abstract not provided.

Research Organization:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
DOE Contract Number:
AC04-94AL85000
OSTI ID:
1147587
Report Number(s):
SAND2007-4420C; 522321
Country of Publication:
United States
Language:
English

Similar Records

Single Event Effect Assessment and Radiation Monitor with an Ion Photon Emission Microscope.
Conference · Tue Jul 01 00:00:00 EDT 2008 · OSTI ID:1143075

Single Event Upset Xilinx-Sandia Experiment (SEUXSE) on the International Space Station.
Conference · Mon Sep 01 00:00:00 EDT 2008 · OSTI ID:1143042

Single Event Upset Xilinx-Sandia Experiment (SEUXSE) and Sandia Passive ISS Research Experiment (SPIRE).
Conference · Thu May 01 00:00:00 EDT 2008 · OSTI ID:1145576

Related Subjects