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Surface Roughness and XRD Studies of Electron Beam Evaporated Mo and Er Films: correlation between substrate and process conditions.

Conference ·
OSTI ID:1146310
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Abstract not provided.

Research Organization:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
DOE Contract Number:
AC04-94AL85000
OSTI ID:
1146310
Report Number(s):
SAND2008-0730C; 519659
Country of Publication:
United States
Language:
English

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