Metrology of 3D nanostructures.
We propose a superresolution technique to resolve dense clusters of blinking emitters. The method relies on two basic assumptions: the emitters are statistically independent, and a model of the imaging system is known. We numerically analyze the performance limits of the method as a function of the emitter density and the noise level. Numerical simulations show that five closely packed emitters can be resolved and localized to a precision of 17nm. The experimental resolution of five quantum dots located within a diffraction limited spot confirms the applicability of this approach.
- Research Organization:
- Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States); University of Colorado,, Boulder, CO
- Sponsoring Organization:
- USDOE National Nuclear Security Administration (NNSA)
- DOE Contract Number:
- AC04-94AL85000
- OSTI ID:
- 1144015
- Report Number(s):
- SAND2012-8966; 456463
- Country of Publication:
- United States
- Language:
- English
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