Self-Voting Dual-Modular-Redundancy Circuits for Single-Event-Transient Mitigation.
Journal Article
·
· IEEE Transactions on Nuclear Science
Abstract not provided.
- Research Organization:
- Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Organization:
- USDOE National Nuclear Security Administration (NNSA)
- DOE Contract Number:
- AC04-94AL85000
- OSTI ID:
- 1143233
- Report Number(s):
- SAND2008-3729J; 517412
- Journal Information:
- IEEE Transactions on Nuclear Science, Journal Name: IEEE Transactions on Nuclear Science Journal Issue: 6 Vol. 55; ISSN 0018-9499
- Country of Publication:
- United States
- Language:
- English
Similar Records
Self-Voting Dual-Modular-Redundancy Circuits for Single-Event-Transient Mitigation.
Circuit Modular Poster.
Impact of Heavy Ion Energy and Nuclear Interactions on Single-Event Upset and Latchup in Integrated Circuits.
Conference
·
Tue Jul 01 00:00:00 EDT 2008
·
OSTI ID:1142901
Circuit Modular Poster.
Conference
·
Wed Jun 01 00:00:00 EDT 2005
·
OSTI ID:1120624
Impact of Heavy Ion Energy and Nuclear Interactions on Single-Event Upset and Latchup in Integrated Circuits.
Journal Article
·
Sun Jul 01 00:00:00 EDT 2007
· IEEE Transactions on Nuclear Science, Dec. 2007
·
OSTI ID:1147634