Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Copy of Use of Power Calculations for Gauging Test Adequacy for One-Shot Devices.

Conference ·
OSTI ID:1141052
Abstract not provided.
Research Organization:
Sandia National Laboratories (SNL-CA), Livermore, CA (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
DOE Contract Number:
AC04-94AL85000
OSTI ID:
1141052
Report Number(s):
SAND2011-4929C; 505791
Country of Publication:
United States
Language:
English

Similar Records

Shock and Vibration Margin Testing for One-Shot Devices in the Energy-Based Capability Framework.
Conference · Thu May 01 00:00:00 EDT 2014 · OSTI ID:1146829

Copy of From Powder to Device: Characterization to Device Fabrication.
Conference · Sat Nov 01 00:00:00 EDT 2008 · OSTI ID:1700562

Copy of Industrial Control System Field Device Analysis.
Conference · Sun Apr 01 00:00:00 EDT 2012 · OSTI ID:1141092

Related Subjects