Simulations of Microchannel Plate Sensitivity to <20 keV X-rays as a Function of Energy and Incident Angle

Conference · Thu Jun 13 04:00:00 EDT 2013

OSTI ID:1136196

Kruschwitz, Craig ^[1]; Wu, M. ^[2]; Rochau, G. A. ^[2]

---

1. NSTec
2. SNL

We present results of Monte Carlo simulations of microchannel plate (MCP) response to x-rays in the 250 eV to 20 keV energy range as a function of both x-ray energy and impact angle. The model is based on the model presented in Rochau et al. (2006). However, while the Rochau et al. (2006) model was two-dimensional, and their results only went to 5 keV, our results have been expanded to 20 keV, and our model has been incorporated into a three-dimensional Monte Carlo MCP model that we have developed over the past several years (Kruschwitz et al. 2011). X-ray penetration through multiple MCP pore walls is increasingly important above 5 keV. The effect of x-ray penetration through multiple pores on MCP performance was studied and is presented.

• Research Organization: Nevada Test Site/National Security Technologies, LLC (United States)
• Sponsoring Organization: USDOE National Nuclear Security Administration (NNSA), Office of Defense Programs (DP) (NA-10)
• DOE Contract Number: AC52-06NA25946
• OSTI ID: 1136196
• Report Number(s): DOE/NV/25946--1798
• Country of Publication: United States
• Language: English

Related Subjects

materials properties
dynamic shock
equation of state
spall
velocity