Cleaning techniques for applied-B ion diodes
Conference
·
OSTI ID:112933
- and others
Measurements and theoretical considerations indicate that the lithium-fluoride (LiF) lithium ion source operates by electron-assisted field-desorption, and provides a pure lithium beam for 10--20 ns. Evidence on both the SABRE (1 TW) and PBFA-II (20 TW) accelerators indicates that the lithium beam is replaced by a beam of protons, and carbon resulting from electron thermal desorption of hydrocarbon surface and bulk contamination with subsequent avalanche ionization. Appearance of contaminant ions in the beam is accompanied by rapid impedance collapse, possibly resulting from loss of magnetic insulation in the rapidly expanding and ionizing, neutral layer. Electrode surface and source substrate cleaning techniques are being developed on the SABRE accelerator to reduce beam contamination, plasma formation, and impedance collapse. We have increased lithium current density a factor of 3 and lithium energy a factor of 5 through a combination of in-situ surface and substrate coatings, impermeable substrate coatings, and field profile modifications.
- Research Organization:
- Sandia National Labs., Albuquerque, NM (United States)
- Sponsoring Organization:
- USDOE, Washington, DC (United States)
- DOE Contract Number:
- AC04-94AL85000
- OSTI ID:
- 112933
- Report Number(s):
- SAND--94-3136C; CONF-950750--38; ON: DE95017882
- Country of Publication:
- United States
- Language:
- English
Similar Records
Surface cleaning techniques and efficient B-field profiles for lithium ion sources on extraction ion diodes
Results of vacuum cleaning techniques on the performance of LiF field-threshold ion sources on extraction applied-B ion diodes at 1--10 TW
Cleaning techniques for intense ion beam sources
Conference
·
Sat Dec 30 23:00:00 EST 1995
·
OSTI ID:163151
Results of vacuum cleaning techniques on the performance of LiF field-threshold ion sources on extraction applied-B ion diodes at 1--10 TW
Journal Article
·
Mon Mar 31 23:00:00 EST 1997
· IEEE Transactions on Plasma Science
·
OSTI ID:522412
Cleaning techniques for intense ion beam sources
Conference
·
Mon Dec 30 23:00:00 EST 1996
·
OSTI ID:428026