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Effect of domain structure on the dielectric nonlinearity in epitaxial BiFeO3 films.

Journal Article · Fri Oct 01 00:00:00 EDT 2010 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.3533017· OSTI ID:1121645

Ihlefeld, Jon F.; Brennecka, Geoffrey L.; Carroll, James; Folkman, Chad M.; Baek, Seung-Hyub; Eom, Chang-Beom

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Research Organization:: Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)

Sponsoring Organization:: USDOE National Nuclear Security Administration (NNSA)

DOE Contract Number:: AC04-94AL85000

OSTI ID:: 1121645

Report Number(s):: SAND2010-7429J; 485781

Journal Information:: Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 26 Vol. 97; ISSN 0003-6951

Country of Publication:: United States

Language:: English

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