Development and Testing of Immersed-Bz Diodes with Cryogenic Anodes.

Conference · Wed Jun 01 00:00:00 EDT 2005

OSTI ID:1117757

Cordova, Steve Ray; Hahn, Kelly Denise; Johnston, Mark D.; Maenchen, John Eric; Molina, Isidro; Puetz, Elizabeth A.; Portillo, Salvador; Bruner, Nichelle Lee ^[1]; Oliver, Bryan Velten ^[1]; Welch, Dale Robert ^[1]; Cooper, Graham ^[2]; McLean, John ^[2]; Droemer, Darryl W. ^[3]; Van De Valde, David M. ^[4]; Gregerson, Darryl ^[5]

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1. Mission Research Corporation, Albuquerque, NM.
2. Atomic Weapons Establishment, Aldermaston, UK.
3. Bechtel-Nevada, Las Vegas, NV.
4. EG&G, Albuquerque, NM.
5. Ktech Corporation, Albuquerque, NM.

Abstract not provided.

• Research Organization: Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
• Sponsoring Organization: USDOE National Nuclear Security Administration (NNSA)
• DOE Contract Number: AC04-94AL85000
• OSTI ID: 1117757
• Report Number(s): SAND2005-3523C; 498566
• Country of Publication: United States
• Language: English