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Title: Lifetime Testing of Metallized Thin Film Capacitors for Inverter Applications.

Conference ·
OSTI ID:1116097

Abstract not provided.

Research Organization:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
DOE Contract Number:
AC04-94AL85000
OSTI ID:
1116097
Report Number(s):
SAND2013-0748C; 480093
Resource Relation:
Conference: Proposed for presentation at the 2013 Photovoltaic Specialists Conference held June 16-21, 2013 in Tampa, FL.
Country of Publication:
United States
Language:
English