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A statistics-based approach to binary image registration with uncertainty analysis.

Journal Article · · IEEE Transactions on Pattern Analysis and Machine Intelligence
OSTI ID:1115296
; ;
Abstract not provided.
Research Organization:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
DOE Contract Number:
AC04-94AL85000
OSTI ID:
1115296
Report Number(s):
SAND2005-7421J; 463613
Journal Information:
IEEE Transactions on Pattern Analysis and Machine Intelligence, Journal Name: IEEE Transactions on Pattern Analysis and Machine Intelligence
Country of Publication:
United States
Language:
English

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