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Raman and Infrared Thermometry for Microsystems

Journal Article · Fri Dec 31 23:00:00 EST 2010 · Journal of Thermal Science and Engineering Applications

DOI:https://doi.org/10.1115/AJTEC2011-44097· OSTI ID:1107069

Phinney, Leslie M.; Lu, Wei-Yang; Serrano, Justin R.

Abstract not provided.

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Research Organization:: Sandia National Laboratories Livermore, CA; Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)

Sponsoring Organization:: USDOE National Nuclear Security Administration (NNSA)

DOE Contract Number:: AC04-94AL85000

OSTI ID:: 1107069

Report Number(s):: SAND2011-7749J; 464975

Journal Information:: Journal of Thermal Science and Engineering Applications, Journal Name: Journal of Thermal Science and Engineering Applications Journal Issue: 3 Vol. 5; ISSN 1948-5085

Publisher:: ASME

Country of Publication:: United States

Language:: English

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