Measurement of the magnetic penetration depth of a superconducting MgB2 thin film with a large intraband diffusivity

Kim, Jeehoon; Haberkorn, N.; Lin, Shi-Zeng; Civale, L.; Nazaretski, E.; Moeckly, B. H.; Yung, C. S.; Thompson, J. D.; Movshovich, R.

doi:10.1103/PhysRevB.86.024501

Measurement of the magnetic penetration depth of a superconducting MgB₂ thin film with a large intraband diffusivity

Journal Article · Thu Jul 05 00:00:00 EDT 2012 · Physical Review. B, Condensed Matter and Materials Physics

DOI:https://doi.org/10.1103/PhysRevB.86.024501· OSTI ID:1103686

Kim, Jeehoon; Haberkorn, N.; Lin, Shi-Zeng; Civale, L.; Nazaretski, E.; Moeckly, B. H.; Yung, C. S.; Thompson, J. D.; Movshovich, R.

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Sponsoring Organization:: USDOE

OSTI ID:: 1103686

Journal Information:: Physical Review. B, Condensed Matter and Materials Physics, Journal Name: Physical Review. B, Condensed Matter and Materials Physics Journal Issue: 2 Vol. 86; ISSN 1098-0121; ISSN PRBMDO

Publisher:: American Physical SocietyCopyright Statement

Country of Publication:: United States

Language:: English

References (36)

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Measurement of the magnetic penetration depth of a superconducting MgB₂ thin film with a large intraband diffusivity