Structural analysis of a completely amorphous {sup 238}Pu-doped zircon by neutron diffraction.

Conference · Wed Dec 16 04:00:00 EST 1998

OSTI ID:11025

Fortner, J A

The structure of a completely amorphous zircon was determined by time-of-flight neutron diffraction at Argonne's Intense Pulsed Neutron Source (IPNS). The sample of metamict zircon (ZrSiO{sub 4}),initially doped to 8.85 weight percent {sup 238}Pi, had been completely amorphized by alpha-recoil damage since its synthesis in 1981 at the Pacific Northwest National Laboratory (PNNL). The measured diffraction structure factor, S(Q), indicated a completely amorphous sample, with no signs of residual zircon microcrystallinity. The pair distribution function obtained indicated that the structure was that of an oxide glass, retaining the Si-0, Zr-0, and O-O bond lengths of crystalline zircon.

• Research Organization: Argonne National Lab., IL (US)
• Sponsoring Organization: US Department of Energy (US)
• DOE Contract Number: W-31109-ENG-38
• OSTI ID: 11025
• Report Number(s): ANL/CMT/CP-96768
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
AMORPHOUS STATE
BOND LENGTHS
DISTRIBUTION FUNCTIONS
DOPED MATERIALS
GLASS
NEUTRON DIFFRACTION
PLUTONIUM 238
RADIATION EFFECTS
STRUCTURE FACTORS
SYNTHESIS
ZIRCON